Device built-in

Comprehensive Analysis of PerkinElmer ICP-OES Optima 8300

1. Instrument Overview

The PerkinElmer Optima 8300 is a high-end vertical-viewing ICP-OES system featuring dual-view technology (axial and radial), combining high sensitivity (detection limits as low as 0.1 ppb) with a wide dynamic range (10⁶). Capable of simultaneously analyzing 72 elements at a rate of 60 samples per minute, its modular design enables rapid maintenance while reducing argon consumption to just 12 L/min - 30% lower than comparable instruments. Widely used in environmental monitoring, food safety, geological exploration, and semiconductor material analysis, it is particularly suited for high-throughput analysis of high-salt and complex matrix samples.

2. Core Technical Features

1. Optical System

   • Echelle grating cross-dispersion technology: Achieves 0.006 nm resolution (at 200 nm) with dual optical path design (separate UV and visible light channels), improving UV sensitivity by 50%.
   • Solid-state detector (SCD): Quantum efficiency >80%, supporting full-spectrum direct reading and simultaneous acquisition of 290,000 pixel data points with lower noise than traditional CID detectors.

2. Plasma System

   • 40.68 MHz self-excited solid-state RF generator: Power stability <0.1%, capable of handling high-salt samples (TDS up to 30%) such as seawater and blood.
   • FlatPlate64 plasma technology: Industry-lowest argon consumption without requiring PlasmaShear64 maintenance, eliminating interference without additional argon.

3. Sample Introduction System

   • Corrosion-resistant nebulizer: Equipped with ruby/sapphire nozzles, resistant to 50% HCl, 20% HF, and 30% NaOH, enabling direct analysis of saturated saline solutions.
   • High-precision gas control: Nebulizer gas flow accuracy of 0.01 L/min, combined with double-door plasma chamber for easy disassembly and cleaning.

3. Typical Applications

1. Environmental Monitoring
   • Water heavy metal detection (EPA 200.7 compliant), trace element analysis in soil (e.g., Cd, Pb), meeting HJ 737-2015 requirements.
2. Food Safety
   • Determination of cadmium in rice (GB 5009.15) and mercury in seafood, with graphite furnace mode sensitivity reaching ppt levels.
3. Semiconductor Material Analysis
   • Metal nanoparticle detection in high-purity sulfuric acid (SP-ICP-MS coupling), wafer surface impurity analysis (VPD technique).

4. Innovations and Industry Contributions

1. Intelligent Method Development
   • Preloaded with over 3,000 optimized analytical spectral lines, featuring automatic background correction and interference elimination (e.g., MSF multi-spectral fitting), with flexibility for user-defined elements.
2. Remote Diagnostics and Automation
   • Syngistix64 software: Real-time plasma status monitoring (via PlasmaCam64 camera), 21 CFR Part 11 compliance, and automated report generation.

5. Service and Support

PerkinElmer provides:

• Global service network: Core parts delivery within 7 days, ≤4-hour response time for critical issues.
• Method development support: Assistance in optimizing experimental conditions (e.g., semiconductor-grade sulfuric acid testing protocols).

Summary

The Optima 8300, with its exceptional stability, intelligent operation, and cross-industry adaptability, sets the benchmark for trace element analysis. Whether meeting stringent environmental monitoring requirements or complying with semiconductor industry standards, this instrument delivers reliable solutions, reinforcing PerkinElmer's technological leadership in analytical instrumentation.